James Madison University
CENTER FOR MATERIALS SCIENCE
nanoscience|modeling|microfabrication|synthesis
 
 
 
 

 
 
OTHER

  • PANalytical MPD Powder X-ray diffractometer (XRD) with X'Celerator detector, high temperature stage, and thin film attachments
  • Location: PH/CH 3M04
  • Mettler Toledo TGA/SDTA 851e thermogravimetric analyzer - mass spectrometer (TGA-MS)
  • Mettler Toledo TGA/SDTA 822e differential scanning calorimeter (DSC)
  • Nima Technologies surface tensiometer
  • Location: PH/CH 3372
  • Redlake high speed imaging camera
  • Location: PH/CH 2332
  • Janis 1.5K He dewar with 7T magnet and closed cycle He refrigerator
  • Instron tensile tester
  • Location: HHS 1027

 


 
 
      PUBLISHER: JMU Center for Materials Science
MSC 4310, Harrisonburg, VA 22807
PHONE: (540) 568-2723 | FAX: (540) 568-2955
FOR INFORMATION CONTACT: Chris Hughes - Privacy Statement

Last Modified: 06/18/08